Detailed features:

Janatek LA-Gold-36

PC-Based Logic Analyzer with Pattern Generator

The LA-Gold-36 is a high performance logic analyzer with an integrated pattern generator. It was designed to be of superior technical quality to ensure measurements of excellent signal integrity. With class-leading specifications, it offers a comprehensive digital debugging environment for the electronics professional.

Key Features

• 1 GHz maximum sampling rate
• 32 channels
• More than 100 MHz input bandwidth
• 1 Meg Samples/channel maximum
• 8-bit pattern generator
• 4 Independent variable thresholds
• Digital logger
• Versatile triggering options, including glitch capture
• External clock input
• Extended capture time function
• Quality SMD grabber test clips
• High speed USB2 connection to PC
• No external power supply
• Runs on Windows 98/ME/2000/XP…

A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-36 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 32 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.

Powerful Software Environment

The software for the LA-Gold-36 is mature and both the logic analyzer and pattern generator are controlled from a single, intuitive user interface.

The LA-Gold-36’s integrated pattern generator can be used in conjunction with the logic analyzer. The user can set up the instrument to output data to the unit under test (UUT) with the pattern generator and then measure its response with the logic analyzer. This, and other flexible triggering options for both the logic analyzer and pattern generator functions, makes the LA-Gold-36 a cut above the rest.

The LA-Gold-36 connects to the PC via USB2.0 for rapid display updates.

Capture the data you want

The flexible triggering options of the LA-Gold-36 make it possible to capture the exact data the user wants to view.

Edge triggering may be set to occur on a rising edge, falling edge or change-of-state on any one or combination of channels.

Pattern (level) conditions are set by specifying a ‘1’, ‘0’ or ‘X’ (don’t care) condition on all channels.

Combinations such as Edge OR Pattern, Edge AND Pattern, Edge THEN Pattern, Pattern THEN Edge, etc. may be set.

Pattern durations may be set to trigger when shorter (glitch capture), or longer than a specified period.

A ‘post trigger delay’ function allows the final data capture to be postponed by an accurate time after trigger detection.

Pattern Generator

The pattern generator, working in close combination with the logic analyzer, adds a new dimension to debugging possibilities.

The 8-channel pattern generator can output data at rates up to 50 MHz. The output pattern can be specified to come from a user file or from the ’Pattern Editor’.

It can be started on various conditions. It can, for example, start on a specific condition in the logic analyzer input signals, similar to a logic analyzer trigger condition.

The outputs of the pattern generator can act as inputs to the unit under test. The response from the unit under test can then be used to trigger the logic analyzer.